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"Detecting Seam-Carved Image by Extreme Learning Machines Using Patch ..."

Hui-Jun Cheng et al. (2020)

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DOI: 10.1109/TSMC.2018.2789460

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tsmc/ChengWLY20
Hui-Jun Cheng, Jyh-Da Wei, Chun-Yuan Lin, Jin Ye:
Detecting Seam-Carved Image by Extreme Learning Machines Using Patch Analysis Method, Jury Voting, and Combinatorial Fusion. IEEE Trans. Syst. Man Cybern. Syst. 50(5): 1850-1864 (2020)

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