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"Determination of Wafer Start Mix in Semiconductor Manufacturing During New ..."

Kuo-Hao Chang, Liam Y. Hsieh (2016)

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DOI: 10.1109/TSMC.2015.2426174

access: closed

type: Journal Article

metadata version: 2023-06-26

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Kuo-Hao Chang, Liam Y. Hsieh:
Determination of Wafer Start Mix in Semiconductor Manufacturing During New Technology Ramp-Up: Model, Solution Method, and an Empirical Study. IEEE Trans. Syst. Man Cybern. Syst. 46(2): 294-302 (2016)

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