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"Just-In-Time Defect Identification and Localization: A Two-Phase Framework."

Meng Yan et al. (2022)

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DOI: 10.1109/TSE.2020.2978819

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tse/YanXFHLL22
Meng Yan, Xin Xia, Yuanrui Fan, Ahmed E. Hassan, David Lo, Shanping Li:
Just-In-Time Defect Identification and Localization: A Two-Phase Framework. IEEE Trans. Software Eng. 48(2): 82-101 (2022)

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