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"Combinatorial Test Generation for Multiple Input Models With Shared ..."

Chang Rao et al. (2022)

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DOI: 10.1109/TSE.2021.3065950

access: closed

type: Journal Article

metadata version: 2022-08-08

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Chang Rao, Nan Li, Yu Lei, Jin Guo, Yadong Zhang, Raghu N. Kacker, D. Richard Kuhn:
Combinatorial Test Generation for Multiple Input Models With Shared Parameters. IEEE Trans. Software Eng. 48(7): 2606-2628 (2022)

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