"On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges ..."

Allen S. Parrish, Stuart H. Zweben (1995)

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DOI: 10.1109/32.489075

access: closed

type: Journal Article

metadata version: 2017-05-17

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  - https://dblp.org/rec/journals/tse/ParrishZ95
Allen S. Parrish, Stuart H. Zweben:
On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria. IEEE Trans. Software Eng. 21(12): 1006-1009 (1995)

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