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"The Impact of Correlated Metrics on the Interpretation of Defect Models."

Jirayus Jiarpakdee, Chakkrit Tantithamthavorn, Ahmed E. Hassan (2021)

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DOI: 10.1109/TSE.2019.2891758

access: closed

type: Journal Article

metadata version: 2021-03-02

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  - https://dblp.org/rec/journals/tse/JiarpakdeeTH21
Jirayus Jiarpakdee, Chakkrit Tantithamthavorn, Ahmed E. Hassan:
The Impact of Correlated Metrics on the Interpretation of Defect Models. IEEE Trans. Software Eng. 47(2): 320-331 (2021)

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