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"Test Input Prioritization for Machine Learning Classifiers."

Xueqi Dang et al. (2024)

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DOI: 10.1109/TSE.2024.3350019

access: closed

type: Journal Article

metadata version: 2024-04-15

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Xueqi Dang, Yinghua Li, Mike Papadakis, Jacques Klein, Tegawendé F. Bissyandé, Yves Le Traon:
Test Input Prioritization for Machine Learning Classifiers. IEEE Trans. Software Eng. 50(3): 413-442 (2024)

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