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"Orthogonal Defect Classification - A Concept for In-Process Measurements."

Ram Chillarege et al. (1992)

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DOI: 10.1109/32.177364

access: closed

type: Journal Article

metadata version: 2017-05-17

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  - journals/tse/ChillaregeBCHMRW92
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  persistent URL:
  - https://dblp.org/rec/journals/tse/ChillaregeBCHMRW92
Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong:
Orthogonal Defect Classification - A Concept for In-Process Measurements. IEEE Trans. Software Eng. 18(11): 943-956 (1992)

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