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"FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage ..."

Ibrahim Ahmed et al. (2019)

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DOI: 10.1145/3354188

access: closed

type: Journal Article

metadata version: 2022-01-08

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Ibrahim Ahmed, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz:
FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications. ACM Trans. Reconfigurable Technol. Syst. 12(4): 20:1-20:28 (2019)

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