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"Evaluating Transient Error Effects in Digital Nanometer Circuits."

Chong Zhao, Xiaoliang Bai, Sujit Dey (2007)

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DOI: 10.1109/TR.2007.903288

access: closed

type: Journal Article

metadata version: 2020-07-09

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Chong Zhao, Xiaoliang Bai, Sujit Dey:
Evaluating Transient Error Effects in Digital Nanometer Circuits. IEEE Trans. Reliab. 56(3): 381-391 (2007)

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