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"Yield Prediction for Integrated Circuits Manufacturing Through ..."
Tao Yuan, Saleem Z. Ramadan, Suk Joo Bae (2011)
- Tao Yuan, Saleem Z. Ramadan
, Suk Joo Bae
:
Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects. IEEE Trans. Reliab. 60(4): 729-741 (2011)
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