"Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In ..."

Tao Yuan, Yue Kuo (2010)

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DOI: 10.1109/TR.2010.2040776

access: closed

type: Journal Article

metadata version: 2020-07-09

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Tao Yuan, Yue Kuo:
Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices. IEEE Trans. Reliab. 59(1): 132-138 (2010)

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