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"Sequential Bayesian Planning for Accelerated Degradation Tests Considering ..."

Kangzhe He et al. (2023)

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DOI: 10.1109/TR.2022.3225273

access: closed

type: Journal Article

metadata version: 2023-09-24

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Kangzhe He, Qiuzhuang Sun, Min Xie, Way Kuo:
Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation. IEEE Trans. Reliab. 72(3): 964-974 (2023)

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