"A Novel Layout-Based Single Event Transient Injection Approach to Evaluate ..."

Yankang Du, Shuming Chen (2016)

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DOI: 10.1109/TR.2015.2427372

access: closed

type: Journal Article

metadata version: 2020-07-09

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Yankang Du, Shuming Chen:
A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology. IEEE Trans. Reliab. 65(1): 248-255 (2016)

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