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"Multiple-Stress Model for One-Shot Device Testing Data Under Exponential ..."

Narayanaswamy Balakrishnan, Man Ho Ling (2012)

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DOI: 10.1109/TR.2012.2208301

access: closed

type: Journal Article

metadata version: 2020-07-09

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Narayanaswamy Balakrishnan, Man Ho Ling:
Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution. IEEE Trans. Reliab. 61(3): 809-821 (2012)

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