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"In Black and White: An Integrated Approach to Class-Level Testing of ..."

Huo Yan Chen et al. (1998)

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DOI: 10.1145/287000.287004

access: closed

type: Journal Article

metadata version: 2019-10-19

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Huo Yan Chen, T. H. Tse, F. T. Chan, Tsong Yueh Chen:
In Black and White: An Integrated Approach to Class-Level Testing of Object-Oriented Programs. ACM Trans. Softw. Eng. Methodol. 7(3): 250-295 (1998)

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