"Characterization Summary of Performance, Reliability, and Threshold ..."

Weihua Liu et al. (2022)

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DOI: 10.1145/3491230

access: closed

type: Journal Article

metadata version: 2024-07-19

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Weihua Liu, Fei Wu, Xiang Chen, Meng Zhang, Yu Wang, Xiangfeng Lu, Changsheng Xie:
Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory. ACM Trans. Storage 18(2): 16:1-16:25 (2022)

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