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"Test Modification for Reduced Volumes of Fail Data."

Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman (2017)

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DOI: 10.1145/3065925

access: closed

type: Journal Article

metadata version: 2018-11-06

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  - https://dblp.org/rec/journals/todaes/PomeranzAV17
Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman:
Test Modification for Reduced Volumes of Fail Data. ACM Trans. Design Autom. Electr. Syst. 22(4): 67:1-67:17 (2017)

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