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"Covering Test Holes of Functional Broadside Tests."

Irith Pomeranz (2021)

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DOI: 10.1145/3441282

access: closed

type: Journal Article

metadata version: 2021-03-16

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Irith Pomeranz:
Covering Test Holes of Functional Broadside Tests. ACM Trans. Design Autom. Electr. Syst. 26(3): 23:1-23:15 (2021)

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