"Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel ..."

Nikolaos Papandreou et al. (2015)

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DOI: 10.1145/2699866

access: closed

type: Journal Article

metadata version: 2018-11-06

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Nikolaos Papandreou, Thomas P. Parnell, Haralampos Pozidis, Thomas Mittelholzer, Evangelos Eleftheriou, Charles Camp, Thomas Griffin, Gary A. Tressler, Andrew Walls:
Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization. ACM Trans. Design Autom. Electr. Syst. 20(4): 62:1-62:24 (2015)

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