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"BIFEST: a built-in intermediate fault effect sensing and test generation ..."

Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang (1999)

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DOI: 10.1145/307988.307992

access: closed

type: Journal Article

metadata version: 2018-11-06

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Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang:
BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults. ACM Trans. Design Autom. Electr. Syst. 4(2): 194-218 (1999)

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