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"An efficient method for analyzing on-chip thermal reliability considering ..."

Yu-Min Lee, Pei-Yu Huang (2013)

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DOI: 10.1145/2491477.2491485

access: closed

type: Journal Article

metadata version: 2018-11-06

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Yu-Min Lee, Pei-Yu Huang:
An efficient method for analyzing on-chip thermal reliability considering process variations. ACM Trans. Design Autom. Electr. Syst. 18(3): 41:1-41:32 (2013)

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