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"Probabilistic transfer matrices in symbolic reliability analysis of logic ..."

Smita Krishnaswamy et al. (2008)

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DOI: 10.1145/1297666.1297674

access: closed

type: Journal Article

metadata version: 2018-11-06

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Smita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes:
Probabilistic transfer matrices in symbolic reliability analysis of logic circuits. ACM Trans. Design Autom. Electr. Syst. 13(1): 8:1-8:35 (2008)

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