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"Yield Optimization for Analog Circuits over Multiple Corners via Bayesian ..."

Nanlin Guo et al. (2024)

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DOI: 10.1145/3626321

access: closed

type: Journal Article

metadata version: 2024-02-10

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Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang, Jun Tao, Xuan Zeng:
Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. ACM Trans. Design Autom. Electr. Syst. 29(1): 12:1-12:17 (2024)

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