"Test vector decomposition-based static compaction algorithms for ..."

Aiman H. El-Maleh, Yahya E. Osais (2003)

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DOI: 10.1145/944027.944030

access: closed

type: Journal Article

metadata version: 2021-10-14

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Aiman H. El-Maleh, Yahya E. Osais:
Test vector decomposition-based static compaction algorithms for combinational circuits. ACM Trans. Design Autom. Electr. Syst. 8(4): 430-459 (2003)

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