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"Reducing test cost of integrated, heterogeneous systems using pass-fail ..."

Sounil Biswas, Hongfei Wang, R. D. (Shawn) Blanton (2014)

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DOI: 10.1145/2566666

access: closed

type: Journal Article

metadata version: 2018-11-06

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Sounil Biswas, Hongfei Wang, R. D. (Shawn) Blanton:
Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis. ACM Trans. Design Autom. Electr. Syst. 19(2): 20:1-20:23 (2014)

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