"Examination Process Modeling for Intelligent Patent Management: A ..."

Han Wu et al. (2025)

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DOI: 10.1145/3712309

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type: Journal Article

metadata version: 2025-10-17

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Han Wu, Le Zhang, Hengshu Zhu, Qi Liu, Enhong Chen, Hui Xiong:
Examination Process Modeling for Intelligent Patent Management: A Multi-aspect Neural Sequential Approach. ACM Trans. Manag. Inf. Syst. 16(3): 24:1-24:23 (2025)

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