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"Using Clustering and Metric Learning to Improve Science Return of Remote ..."

David S. Hayden et al. (2012)

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DOI: 10.1145/2168752.2168765

access: closed

type: Journal Article

metadata version: 2021-02-24

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David S. Hayden, Steve A. Chien, David R. Thompson, Rebecca Castaño:
Using Clustering and Metric Learning to Improve Science Return of Remote Sensed Imagery. ACM Trans. Intell. Syst. Technol. 3(3): 51:1-51:19 (2012)

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