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"Back-Projection Based Fidelity Term for Ill-Posed Linear Inverse Problems."

Tom Tirer, Raja Giryes (2020)

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DOI: 10.1109/TIP.2020.2988779

access: closed

type: Journal Article

metadata version: 2020-10-11

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Tom Tirer, Raja Giryes:
Back-Projection Based Fidelity Term for Ill-Posed Linear Inverse Problems. IEEE Trans. Image Process. 29: 6164-6179 (2020)

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