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"Remaining useful lifetime prediction of thermally aged power insulated ..."

Adla Ismail et al. (2020)

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DOI: 10.1177/0142331220920470

access: closed

type: Journal Article

metadata version: 2022-02-04

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Adla Ismail, Lotfi Saidi, Mounir Sayadi, Mohamed Benbouzid:
Remaining useful lifetime prediction of thermally aged power insulated gate bipolar transistor based on Gaussian process regression. Trans. Inst. Meas. Control 42(13): 2507-2518 (2020)

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