"Surface Layer Analysis of Si Sphere by XRF and XPS."

Lulu Zhang et al. (2015)

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DOI: 10.1109/TIM.2015.2389352

access: closed

type: Journal Article

metadata version: 2024-10-16

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Lulu Zhang, Yasushi Azuma, Akira Kurokawa, Naoki Kuramoto, Kenichi Fujii:
Surface Layer Analysis of Si Sphere by XRF and XPS. IEEE Trans. Instrum. Meas. 64(6): 1509-1513 (2015)

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