"Position-Aware Self-Supervised Learning for Wafer Map Defect Pattern ..."

Wei Yuan, Jinda Yan, Minghao Piao (2025)

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DOI: 10.1109/TIM.2025.3606012

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type: Journal Article

metadata version: 2025-10-14

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Wei Yuan, Jinda Yan, Minghao Piao:
Position-Aware Self-Supervised Learning for Wafer Map Defect Pattern Recognition. IEEE Trans. Instrum. Meas. 74: 1-11 (2025)

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