Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Back-Gate Fully Depleted Silicon-on-Insulator P-Channel Schottky Barrier ..."

Haihua Wang et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TIM.2024.3373082

access: closed

type: Journal Article

metadata version: 2024-04-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/WangZCJW24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/WangZCJW24
Haihua Wang, Zekun Zhao, Qiumeng Chen, Yu-Long Jiang, Jing Wan:
Back-Gate Fully Depleted Silicon-on-Insulator P-Channel Schottky Barrier MOSFET With Ultrahigh Voltage Sensitivity for Label-Free Virus RNA Detection. IEEE Trans. Instrum. Meas. 73: 1-8 (2024)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.