"A General Automatic Test System for Instruments in IC Equipment."

Xiaoshan Su, Ling Tian (2012)

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DOI: 10.1109/TIM.2012.2188659

access: closed

type: Journal Article

metadata version: 2020-06-08

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Xiaoshan Su, Ling Tian:
A General Automatic Test System for Instruments in IC Equipment. IEEE Trans. Instrum. Meas. 61(9): 2591-2599 (2012)

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