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"Combined spectral and histogram analysis for fast ADC testing."
António Manuel da Cruz Serra et al. (2005)
- António Manuel da Cruz Serra, Manuel Fonseca da Silva, Pedro M. Ramos
, Raul Carneiro Martins
, Linus Michaeli, Ján Saliga
:
Combined spectral and histogram analysis for fast ADC testing. IEEE Trans. Instrum. Meas. 54(4): 1617-1623 (2005)
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