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"Comparison of contactless measurement and testing techniques to a ..."

Selahattin Sayil, David V. Kerns, Sherra E. Kerns (2005)

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DOI: 10.1109/TIM.2005.854253

access: closed

type: Journal Article

metadata version: 2020-06-08

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Selahattin Sayil, David V. Kerns, Sherra E. Kerns:
Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method. IEEE Trans. Instrum. Meas. 54(5): 2082-2089 (2005)

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