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"Cryogenic noise parameter measurements of microwave devices."

Ilona Rolfes, Thomas Musch, Burkhard Schiek (2001)

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DOI: 10.1109/19.918145

access: closed

type: Journal Article

metadata version: 2020-06-08

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Ilona Rolfes, Thomas Musch, Burkhard Schiek:
Cryogenic noise parameter measurements of microwave devices. IEEE Trans. Instrum. Meas. 50(2): 373-376 (2001)

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