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"Broad-band characterization of magnetic and dielectric thin films using a ..."

Patrick Quéffélec, Marcel Le Floc'h, Philippe Gelin (1998)

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DOI: 10.1109/19.744649

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - journals/tim/QueffelecFG98
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  - https://dblp.org/rec/journals/tim/QueffelecFG98
Patrick Quéffélec, Marcel Le Floc'h, Philippe Gelin:
Broad-band characterization of magnetic and dielectric thin films using a microstrip line. IEEE Trans. Instrum. Meas. 47(4): 956-963 (1998)

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