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"Characterization of 65-nm CMOS Integrated Resistors in the Cryogenic Regime."

Jorge Marqués-García et al. (2024)

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DOI: 10.1109/TIM.2024.3381286

access: closed

type: Journal Article

metadata version: 2024-04-16

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  - https://dblp.org/rec/journals/tim/MarquesGarciaPCS24
Jorge Marqués-García, Jorge Pérez-Bailón, Santiago Celma, Carlos Sánchez-Azqueta:
Characterization of 65-nm CMOS Integrated Resistors in the Cryogenic Regime. IEEE Trans. Instrum. Meas. 73: 1-3 (2024)

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