"Lightweight Method for Insulator Defect Detection Based on Improved ..."

Jiefeng Liu et al. (2025)

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DOI: 10.1109/TIM.2025.3599701

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type: Journal Article

metadata version: 2025-10-15

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Jiefeng Liu, Yang Ou, Zikai Zhou, Runnong Jiao, Thomas Wu:
Lightweight Method for Insulator Defect Detection Based on Improved Convolutional Neural Networks. IEEE Trans. Instrum. Meas. 74: 1-10 (2025)

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