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"Frequency Extension of Atomic Measurement of Microwave Strength Using ..."

Moto Kinoshita, Yuya Tojima, Hitoshi Iida (2019)

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DOI: 10.1109/TIM.2018.2886869

access: closed

type: Journal Article

metadata version: 2021-02-19

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Moto Kinoshita, Yuya Tojima, Hitoshi Iida:
Frequency Extension of Atomic Measurement of Microwave Strength Using Zeeman Effect. IEEE Trans. Instrum. Meas. 68(6): 2274-2279 (2019)

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