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"Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for ..."

Chun-Lung Hsu, Mean-Hom Ho, Chin-Feng Lin (2009)

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DOI: 10.1109/TIM.2009.2013668

access: closed

type: Journal Article

metadata version: 2020-06-08

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Chun-Lung Hsu, Mean-Hom Ho, Chin-Feng Lin:
Novel Built-In Current-Sensor-Based I_DDQ Testing Scheme for CMOS Integrated Circuits. IEEE Trans. Instrum. Meas. 58(7): 2196-2208 (2009)

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