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"Built-in Self-Test Design for Fault Detection and Fault Diagnosis in ..."

Chun-Lung Hsu, Ting-Hsuan Chen (2009)

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DOI: 10.1109/TIM.2009.2013921

access: closed

type: Journal Article

metadata version: 2020-06-08

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Chun-Lung Hsu, Ting-Hsuan Chen:
Built-in Self-Test Design for Fault Detection and Fault Diagnosis in SRAM-Based FPGA. IEEE Trans. Instrum. Meas. 58(7): 2300-2315 (2009)

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