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"Highly Stable Pin Pull Test Method for PCB Pad Cratering Characterization."

Hengjian He et al. (2024)

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DOI: 10.1109/TIM.2023.3338663

access: closed

type: Journal Article

metadata version: 2024-01-13

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Hengjian He, Miao Cai, Minghui Yun, Hao Chen, Huanhuan Wang, Dao-Guo Yang:
Highly Stable Pin Pull Test Method for PCB Pad Cratering Characterization. IEEE Trans. Instrum. Meas. 73: 1-8 (2024)

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