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"A New Test Procedure to Measure Power Electronic Devices' Frequency ..."

Daniele Gallo et al. (2018)

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DOI: 10.1109/TIM.2018.2819318

access: open

type: Journal Article

metadata version: 2020-06-08

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Daniele Gallo, Roberto Langella, Mario Luiso, Alfredo Testa, Neville R. Watson:
A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance. IEEE Trans. Instrum. Meas. 67(10): 2401-2409 (2018)

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