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"Temperature controlled oven for low noise measurement systems [for ..."

Carmine Ciofi et al. (2000)

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DOI: 10.1109/19.850392

access: closed

type: Journal Article

metadata version: 2022-01-03

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Carmine Ciofi, Ivan Ciofi, Stefano C. Di Pascoli, Bruno Neri:
Temperature controlled oven for low noise measurement systems [for electromigration characterization]. IEEE Trans. Instrum. Meas. 49(3): 546-549 (2000)

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