Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Virtual Metrology System for Predicting End-of-Line Electrical ..."

Tian-Hong Pan et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TII.2010.2098416

access: closed

type: Journal Article

metadata version: 2020-05-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tii/PanSWJ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tii/PanSWJ11
Tian-Hong Pan, Bi-Qi Sheng, David Shan-Hill Wong, Shi-Shang Jang:
A Virtual Metrology System for Predicting End-of-Line Electrical Properties Using a MANCOVA Model With Tools Clustering. IEEE Trans. Ind. Informatics 7(2): 187-195 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.