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"A General Degradation Process of Useful Life Analysis Under Unreliable ..."

Yang Li et al. (2023)

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DOI: 10.1109/TII.2022.3224960

access: closed

type: Journal Article

metadata version: 2024-04-25

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  - https://dblp.org/rec/journals/tii/LiXCJM23
Yang Li, Shuiqing Xu, Hongtian Chen, Li Jia, Kun Ma:
A General Degradation Process of Useful Life Analysis Under Unreliable Signals for Accelerated Degradation Testing. IEEE Trans. Ind. Informatics 19(6): 7742-7750 (2023)

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