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"Deep Metric Color Embeddings for Splicing Localization in Severely ..."

Benjamin Christopher Hadwiger, Christian Riess (2022)

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DOI: 10.1109/TIFS.2022.3189527

access: closed

type: Journal Article

metadata version: 2022-08-08

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Benjamin Christopher Hadwiger, Christian Riess:
Deep Metric Color Embeddings for Splicing Localization in Severely Degraded Images. IEEE Trans. Inf. Forensics Secur. 17: 2614-2627 (2022)

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