"Intrinsic Physical-Layer Authentication of Integrated Circuits."

William E. Cobb et al. (2012)

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DOI: 10.1109/TIFS.2011.2160170

access: closed

type: Journal Article

metadata version: 2020-08-06

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William E. Cobb, Eric D. Laspe, Rusty O. Baldwin, Michael A. Temple, Yong C. Kim:
Intrinsic Physical-Layer Authentication of Integrated Circuits. IEEE Trans. Inf. Forensics Secur. 7(1): 14-24 (2012)

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